Showing results: 136 - 150 of 344 items found.
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TCM1001 -
Rhesca Co., Ltd.
In recent years, there has been a demand for small and thin electronic products such as mobile devices, and printed circuit boards are shifting to thin, multi-layered, and even modularized printed circuit boards. effect of bonding materials, that is, the ability to easily conduct heat, is emphasized, and testing equipment that evaluates thermal conductivity is required .As a business of our company, we have mainly manufactured and sold test equipment for solder wettability tests and solder bonding strength, but there was a need to urgently develop next-generation bonding material test equipment to replace these. Under these circumstances, we received a request from an academic research facility to manufacture a device that can measure the thermal conductivity of conductive adhesives under research and development, and we were able to obtain an opportunity to develop the device. We proceeded with the development based on these requirements .
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RF ITS -
Sterner Automation Limited
Sterner's automated test management system, combined with integrated RF technology modules, provides full functionality, including: Apply power to the device under test (DUT). Read and write blocks of data to set up and validate product EEPROM using a hard-wired communications interface. Scan transmitting devices or traveller barcodes and write the information to the DUT (the "sign-up process"). Inject an RF signal of known frequency and power level to test receiver sensitivity.
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41-750-001 -
Pickering Interfaces Ltd.
The 41-750 is a battery simulator module that can be used to simulate the power supplies of cellular phones and other portable battery devices. It features fully floating output terminals than can deliver voltages up to 6 Volts. The fast responding remote sense connections allow the module to regulate the supply voltage at the device under test.
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IEC60884 fig38 -
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 fig38 thermal compression test device for plug testingUsed to evaluate the pressure resistance of electrical accessories and wall mounted mounting boxes under heatStandard: GB2099.1-2008 Articles 24.19 and 25.4 and Figure 38, IEC60884-1 Figure 38, etc.
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P5570A -
Keysight Technologies
Keysight PCIe 6.0 Protocol Analyzer redefines protocol debugging and validation through a new innovative CEM card form factor, bringing vast improvement in signal integrity and equalization with instant link-up to systems as well as devices under test
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780587-15 -
NI
PXIe, 35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXIe‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXIe‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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778572-15 -
NI
35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXI‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXI‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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40-658-002 -
Pickering Interfaces Ltd.
This PXI multiplexer combines a 2-pole 18-way power distribution MUX with a second lower power 2-pole 18-way MUX in one convenient single slot PXI module.The module is ideal for power distribution where power and sense signals are required to be connected to an array of devices under test. This multiplexer is also convenient for making 4 wire low resistance measurements by supplying the resistor under test with high current through the power MUX and sensing the voltage drop through the sense MUX.
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EP1150A -
Keysight Technologies
PathWave Lab Operations for Battery Test enables efficient planning and coordination of your entire battery test laboratory. It manages all resources, including test fields, test systems, and your device under test (DUT). PathWave provides an integrated, web-based lab management platform that helps you modernize your test workflows, eliminating legacy paper-based processes, and increasing data integrity and traceability.
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Hydraulic Dynos -
Taylor Dynamometer, Inc.
Ideal for a wide range of markets, water brake engine dynamometers churn water inside the housing and transfers energy by momentum exchange and water shear. The more water flowing through the dyno, the greater the braking force exerted on the device under test.
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N6731B -
Keysight Technologies
The Keysight N6731B, a 50 W basic DC power module, provides programmable voltage and current, as well as measurement and protection features at a very economical price. Use this module to power the device under test or ATE system resources, such as fixture control.
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41-751-001 -
Pickering Interfaces Ltd.
The 41-751 is a low power battery simulator module that can be used to simulate the power supplies of cellular phones and other portable battery devices. It features fully floating output terminals than can deliver voltages up to 6 Volts. The fast responding remote sense connections allow the module to regulate the supply voltage at the device under test.
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xUTS -
Bloomy Controls, Inc.
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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NX5300 -
Terotest Systems Ltd.
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.